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tms570 jtag 调试问题

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板子上带有tms570ls20216和tms570LC4357,调试都遇到问题

遇到过的给指点一下吧,电源晶振都正常,实在不知道去哪里找问题了,

20216debug的时候报错

CortexR4: Flash Programmer: Error erasing Bank 0, Sector 0. Operation Cancelled.

4357接jtag调试时,xds100v2那的测试不能通过报错

The test for the JTAG IR instruction path-length failed.

The JTAG IR instruction scan-path is stuck-at-zero.

 

The test for the JTAG DR bypass path-length failed.

The JTAG DR bypass scan-path is stuck-at-zero.

 

Do a test using 0xFFFFFFFF.

Test 1 Word 0: scanned out 0xFFFFFFFF and scanned in 0x00000000.

Test 1 Word 1: scanned out 0xFFFFFFFF and scanned in 0x00000000.

Test 1 Word 2: scanned out 0xFFFFFFFF and scanned in 0x00000000.

Test 1 Word 3: scanned out 0xFFFFFFFF and scanned in 0x00000000.

Test 1 Word 4: scanned out 0xFFFFFFFF and scanned in 0x00000000.

Test 1 Word 5: scanned out 0xFFFFFFFF and scanned in 0x00000000.

Test 1 Word 6: scanned out 0xFFFFFFFF and scanned in 0x00000000.

Test 1 Word 7: scanned out 0xFFFFFFFF and scanned in 0x00000000.

The details of the first 8 errors have been provided.

The utility will now report only the count of failed tests.

Scan tests: 1, skipped: 0, failed: 1

Do a test using 0x00000000.

Scan tests: 2, skipped: 0, failed: 1

Do a test using 0xFE03E0E2.

Scan tests: 3, skipped: 0, failed: 2

Do a test using 0x01FC1F1D.

Scan tests: 4, skipped: 0, failed: 3

Do a test using 0x5533CCAA.

Scan tests: 5, skipped: 0, failed: 4

Do a test using 0xAACC3355.

Scan tests: 6, skipped: 0, failed: 5

Some of the values were corrupted - 83.3 percent.

 

The JTAG IR Integrity scan-test has failed.

 

-----[Perform the Integrity scan-test on the JTAG DR]------------------------

 

This test will use blocks of 512 32-bit words.

This test will be applied just once.

 

Do a test using 0xFFFFFFFF.

Test 1 Word 0: scanned out 0xFFFFFFFF and scanned in 0x00000000.

Test 1 Word 1: scanned out 0xFFFFFFFF and scanned in 0x00000000.

Test 1 Word 2: scanned out 0xFFFFFFFF and scanned in 0x00000000.

Test 1 Word 3: scanned out 0xFFFFFFFF and scanned in 0x00000000.

Test 1 Word 4: scanned out 0xFFFFFFFF and scanned in 0x00000000.

Test 1 Word 5: scanned out 0xFFFFFFFF and scanned in 0x00000000.

Test 1 Word 6: scanned out 0xFFFFFFFF and scanned in 0x00000000.

Test 1 Word 7: scanned out 0xFFFFFFFF and scanned in 0x00000000.

The details of the first 8 errors have been provided.

The utility will now report only the count of failed tests.

Scan tests: 1, skipped: 0, failed: 1

Do a test using 0x00000000.

Scan tests: 2, skipped: 0, failed: 1

Do a test using 0xFE03E0E2.

Scan tests: 3, skipped: 0, failed: 2

Do a test using 0x01FC1F1D.

Scan tests: 4, skipped: 0, failed: 3

Do a test using 0x5533CCAA.

Scan tests: 5, skipped: 0, failed: 4

Do a test using 0xAACC3355.

Scan tests: 6, skipped: 0, failed: 5

Some of the values were corrupted - 83.3 percent.

 

The JTAG DR Integrity scan-test has failed.

 

[End: Texas Instruments XDS100v2 USB Emulator_0]


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